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STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging

Yi Wang,Y. Eren Suyolcu,Ute Salzberger,Kersten Hahn,Vesna Srot,Wilfried Sigle,Peter A. van Aken

Microscopy and Microanalysis（2018）

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stem si warp,diffraction imaging,stem spectrum,nonlinear distortions
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