7 nm Spatial Resolution in Soft X-ray Microscopy

Microscopy and Microanalysis(2018)

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Abstract
Journal Article 7 nm Spatial Resolution in Soft X-ray Microscopy Get access Benedikt Rösner, Benedikt Rösner Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Benedikt Rösner, benedikt.roesner@psi.ch Search for other works by this author on: Oxford Academic Google Scholar Frieder Koch, Frieder Koch Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Florian Döring, Florian Döring Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Vitaliy A Guzenko, Vitaliy A Guzenko Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Markus Meyer, Markus Meyer Department Chemistry and Pharmacy, FAU Erlangen-Nürnberg, Egerlandstr. 3, 91058 Erlangen, Germany Search for other works by this author on: Oxford Academic Google Scholar Joshua L Ornelas, Joshua L Ornelas Department Chemistry and Pharmacy, FAU Erlangen-Nürnberg, Egerlandstr. 3, 91058 Erlangen, Germany Search for other works by this author on: Oxford Academic Google Scholar Andreas Späth, Andreas Späth Department Chemistry and Pharmacy, FAU Erlangen-Nürnberg, Egerlandstr. 3, 91058 Erlangen, Germany Search for other works by this author on: Oxford Academic Google Scholar Rainer H Fink, Rainer H Fink Department Chemistry and Pharmacy, FAU Erlangen-Nürnberg, Egerlandstr. 3, 91058 Erlangen, Germany Search for other works by this author on: Oxford Academic Google Scholar Stefan Stanescu, Stefan Stanescu Synchrotron SOLEIL, L’ormes des Merisiers, Saint Aubin BP-48, 91192, Gif-Sur-Yvette Cedex, France Search for other works by this author on: Oxford Academic Google Scholar Sufal Swaraj, Sufal Swaraj Synchrotron SOLEIL, L’ormes des Merisiers, Saint Aubin BP-48, 91192, Gif-Sur-Yvette Cedex, France Search for other works by this author on: Oxford Academic Google Scholar ... Show more Rachid Belkhou, Rachid Belkhou Synchrotron SOLEIL, L’ormes des Merisiers, Saint Aubin BP-48, 91192, Gif-Sur-Yvette Cedex, France Search for other works by this author on: Oxford Academic Google Scholar Benjamin Watts, Benjamin Watts Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Jörg Raabe, Jörg Raabe Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Christian David Christian David Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 24, Issue S2, 1 August 2018, Pages 270–271, https://doi.org/10.1017/S1431927618013697 Published: 10 August 2018
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Key words
nm spatial resolution,x-ray
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