A Low-Cost Pulsed Rf & I-V Measurement Setup For Isothermal Device Characterization
2007 70TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG)(2007)
Abstract
A low-cost, highly versatile, pulsed RF - pulsed I-V isothermal device characterization setup is presented. The realized setup combines a synthetic instrument high dynamic range pulsed network analyzer with pulsed I-V measurements. The resulting configuration facilitates very accurate characterization of low-power as well as high-power devices over a wide range of bias and pulse conditions. The achieved system accuracy is reported, and its measurement capabilities are highlighted through the characterization of self-heating effects in LDMOS devices and silicon-on-glass VDMOS.
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Key words
Device characterization,dynamic range,isothermal,pulsed measurements
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