Atomic Scale Structural Analysis of Sn-Si Quantum Dots

Microscopy and Microanalysis(2002)

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Journal Article Atomic Scale Structural Analysis of Sn-Si Quantum Dots Get access Y Lei, Y Lei Dept. of Physics, University of Illinois at Chicago, 845 W. Taylor St., Chicago, IL 60607, USA Search for other works by this author on: Oxford Academic Google Scholar P Möck, P Möck Dept. of Physics, University of Illinois at Chicago, 845 W. Taylor St., Chicago, IL 60607, USA Search for other works by this author on: Oxford Academic Google Scholar T Topuria, T Topuria Dept. of Physics, University of Illinois at Chicago, 845 W. Taylor St., Chicago, IL 60607, USA Search for other works by this author on: Oxford Academic Google Scholar N D Browning, N D Browning Dept. of Physics, University of Illinois at Chicago, 845 W. Taylor St., Chicago, IL 60607, USA Search for other works by this author on: Oxford Academic Google Scholar R Ragan, R Ragan Thomas J. Watson Laboratory of Applied Physics, California Institute of Technology, MS 128-95, Pasadena, CA 91125, USA Search for other works by this author on: Oxford Academic Google Scholar H A Atwater H A Atwater Thomas J. Watson Laboratory of Applied Physics, California Institute of Technology, MS 128-95, Pasadena, CA 91125, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 1114–1115, https://doi.org/10.1017/S1431927602103643 Published: 01 November 2002
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