Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions

Laurent Artola,Guillaume Hubert,S. Ducret,J. Mekki,Ahmad Al Youssef,Nicolas Ricard

IEEE Transactions on Nuclear Science（2018）

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摘要

This paper highlights the impact of design on the single-event upset (SEU) sensitivity of D-flip-flops (DFFs) used in a readout circuit (ROIC) under heavy ions. New experimental data obtained at the University of Louvain for several designs are presented. The single-event effect (SEE) prediction tool multi-scale single event phenomena predictive platform is used to investigate the failure occurren...

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关键词

Single event upsets,Sensitivity,Radiation effects,Computer architecture,Temperature measurement,Transistors

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