Accelerated Life Testing and Fault Analysis of High-Power LED

Han-Kuei Fu,Shang-Ping Ying,Tzung-Te Chen,Hsin-Hsin Hsieh,Yao-Cheng Yang

IEEE Transactions on Electron Devices（2018）

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摘要

The quality assessment and reliability improvement of high-power light-emitting diodes (LEDs), which are used in lighting applications, are important. Conventional lifetime testing for LEDs lasts approximately 6000 h. Accelerated life testing (ALT) to quickly assess LED quality and faults is essential for the mass production of LEDs. This paper conducted a systematic nondestructive fault analysis ...

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关键词

Light emitting diodes,Resistance,Reliability,Photonics,Nondestructive testing,P-n junctions

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