A combined atomic force- and tunneling microscopy system at 10mK temperatureJohannes Schwenk,Sungmin Kim,Julian Berwanger,Steven R. Blankenship,William G. Cullen,Young Kuk,Franz J. Giessibl,Joseph A. StroscioBulletin of the American Physical Society(2018)引用 23|浏览24暂无评分关键词microscopy systemAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要