Design and Implementation of a Test Circuit of a Repetitive Critical Rate of Rise of ON-State Current for a High-Power Thyristor

A test circuit of a repetitive critical rate of rise of ON-state current (di/dt) for a high-power thyristor is designed and implemented. The operating principle of the test circuit specified in the standard IEC-60747-6 is explained in detail. The design example for the circuit to test repetitive di/dt of 300 A/μs for a thyristor having a mean ON-state current of 2200 A is presented. The value of t...