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Investigation of Ionizing Transients by Femtosecond X-ray Source Ionization

M. P. Belova,L. N. Kessarinskiy,A. Y. Borisov,A. I. Chumakov,D. V. Boychenko,K. A. Ivanov,I. N. Tsymbalov,R. V. Volkov,A. B. Savel'ev

2017 IEEE 30th International Conference on Microelectronics (MIEL)（2017）

引用 0|浏览17
关键词
p-i-n diode,TW titanium:Sa femtosecond laser facility,operational amplifier,femtosecond X-ray source ionization,Ti
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