Charged device discharge measurement methods in electronics manufacturing
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)(2017)
摘要
Electrical components with a lower CDM ESD immunity can require additional protection methods in manufacturing. Discharge current measurements and electromagnetic pulse detection gives valuable data for more detailed ESD risk assessments. However, both methods require sophisticated tools and trained personnel to get accurate data for control purposes.
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关键词
discharge current measurements,electromagnetic pulse detection,charged device discharge measurement methods,electronics manufacturing,electrical components,protection methods,ESD risk assessments,CDM ESD immunity
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