Development of a Fast Framing Detector for Electron Microscopy

Ian J. Johnson,Karen C. Bustillo,Jim Ciston,Eli Dart,Brent R. Draney,Peter Ercius,Erin Fong,Carl R. Grace,John M. Joseph,Jason R. Lee,Andrew M. Minor,Colin Ophus,David E. Skinner,Thorsten Stezelberger,Craig S. Tindall,Peter Denes

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)（2016）

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scanning transmission electron microscopy,National Center for Electron Microscopy,scanning diffraction experiments,STEM,Cori supercomputer,firmware,sample alignment,sample monitoring,sample verification,live data processing,National Energy Research Scientific Computing Center,low-level preprocessing,data stream,central pixel sensor,data transportation,data producing detector,end-to-end development,real-time data analysis,high frame rate detector system,fast framing detector

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