Ultra-compact sub-10nm logic circuits based on ambipolar SB-FinFETs

2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)(2017)

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摘要
Novel ultra-compact sub-10nm XOR, NOR and NAND CMOS logic circuits based on ambipolar characteristics of Schottky-Barrier (SB) FinFET devices and gate metal workfunction engineering are introduced. Use of SB source and drain contacts, high-k gate dielectrics and ultra-thin body bestows extreme short-channel immunity to the proposed FinFETs with ambipolar current-voltage characteristics. Thus, the main physical parameter left for practical device design and threshold control is the gate workfunction along with independent-gate drive, which is creatively used in this work to build a novel conjugate (n/p channel) CMOS pass-gate transistor that can function as a two-transistor (2T) XOR gates as opposed to 4 transistor conventional pass-gates. In a similar fashion, gate workfunction engineering can be utilized to design unique ambipolar FinFETs with two independent gates and high thresholds to function as 2T NAND and NOR gates. Functionality of the proposed minimalist logic circuits are verified with Synopsys TCAD simulations, which indicate that optimized gate work-functions lead to CMOS logic circuits as small as 5nm and supply voltage of 0.6V, with a power-delay product at 5 × 10 -18 J level.
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关键词
ultra-compact sub-10nm logic circuits,ambipolar SB-FinFETs,NAND CMOS logic circuits,Schottky-Barrier FinFET devices,gate metal workfunction engineering,drain contacts,high-k gate dielectrics,short-channel immunity,main physical parameter,threshold control,independent-gate drive,CMOS pass-gate transistor,two-transistor XOR gates,independent gates,minimalist logic circuits,optimized gate work-functions,XOR CMOS logic circuits,NOR CMOS logic circuits,ultra-thin body,ambipolar current-voltage characteristics,Synopsys TCAD simulations,size 10.0 nm,size 5.0 nm,voltage 0.6 V
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