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Solar Wind Sputtering Rates of Small Bodies and Ion Mass Spectrometry Detection of Secondary Ions

Lunar and Planetary Science Conference(2017)

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摘要
Solar wind interactions with the surfaces of asteroids and small moons eject atoms and molecules from the uppermost several nanometers of regolith grains through a process called sputtering. A small fraction of the sputtered species, called secondary ions, leave the surface in an ionized state, and these are diagnostic of the surface composition. Detection of secondary ions using ion mass spectrometry (IMS) provides a powerful method of analysis due to low backgrounds and high instrument sensitivities. However, the sputtered secondary ion yield and the atomic composition of the surface are not 1‐to‐1 correlated. Thus, relative yield fractions based on experimental measurements are needed to convert measured spectra to surface composition. Here available experimental results are combined with computationally derived solar wind sputtering yields to estimate secondary ion fluxes from asteroid‐sized bodies in the solar system. The Monte Carlo simulation code SDTrimSP is used to estimate the total sputtering yield due to solar wind ion bombardment for a diverse suite of meteorite and lunar soil compositions. Experimentally measured relative secondary ion yields are analyzed to determine the abundance of refractory species (Mg + , Al + , Ca + , and Fe + ) relative to Si + , and it is shown that relative abundances indicate whether a body is primitive or has undergone significant geologic reprocessing. Finally, estimates of the sputtered secondary ion fluxes are used to determine the IMS sensitivity required to adequately resolve major element ratios for nominal orbital geometries.
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关键词
Secondary Ion Mass Spectrometry,Swift Heavy Ions,Surface Analysis,Surface Composition,Cluster Ion
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