Temporal Compressive Sensing Instrumentation for TEM

Journal Article Temporal Compressive Sensing Instrumentation for TEM Get access Daniel J Masiel, Daniel J Masiel Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America Search for other works by this author on: Oxford Academic Google Scholar Ruth S Bloom, Ruth S Bloom Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America Search for other works by this author on: Oxford Academic Google Scholar Sang Tae Park, Sang Tae Park Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America Search for other works by this author on: Oxford Academic Google Scholar Bryan W Reed Bryan W Reed Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 20–21, https://doi.org/10.1017/S1431927617000782 Published: 04 August 2017