Advanced Nanofabrication And Its Application To Nano Phase-Change Memory For Reducing Writing Current

2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)(2016)

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摘要
In this work, we studied the advanced nanofabrication technologies including electron beam lithography, blockcopolymer-based self assembly fabrication and their combination lithography, that is, directed self assembly (DSA). Nanostructures with a size of 10 nm order were successfully fabricated using these technologies. We attempted to further incorporate these nanostructures fabricated by these advanced technologies into phase-change memory to reduce writing current. It was revealed that the novel PCM could have only about 1/10 writing current of conventional one.
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关键词
nanophase-change memory,writing current reduction,advanced nanofabrication technologies,electron beam lithography,blockcopolymer-based self assembly fabrication,combination lithography,directed self assembly,DSA,nanostructures,PCM,size 10 nm
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