A Study on Practically Unlimited Endurance of STT-MRAM
IEEE Transactions on Electron Devices(2017)
摘要
Magnetic tunnel junctions integrated for spin-transfer torque magnetoresistive random-access memory are by far the only known solid-state memory element that can realize a combination of fast read/write speed and high endurance. This paper presents a comprehensive validation of high endurance of deeply scaled perpendicular magnetic tunnel junctions (pMTJs) in light of various potential spin-transf...
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关键词
Electric breakdown,Stress,Reliability,Breakdown voltage,Magnetic tunneling,Torque,Magnetoresistance
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