Measurement of Refractive Indices of CdSiP_2 at Temperatures from 85 to 450 K

Jean Wei,Joel M. Murray,Frank Kenneth Hopkins,Douglas M. Krein,Kevin T. Zawilski,Peter G. Schunemann,Shekhar Guha

Nonlinear Optics（2017）

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Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text J. Wei, J. M. Murray, F. K. Hopkins, D. M. Krein, K. T. Zawilski, P. G. Schunemann, and S. Guha, "Measurement of Refractive Indices of CdSiP2 at Temperatures from 85 to 450 K," in Nonlinear Optics, OSA Technical Digest (online) (Optica Publishing Group, 2017), paper NTu3A.8. Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article

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refractive indices,cdsip2,temperatures

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