200 V Enhancement-Mode p-GaN HEMTs Fabricated on 200 mm GaN-on-SOI With Trench Isolation for Monolithic Integration

IEEE Electron Device Letters(2017)

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Abstract
Monolithic integration of a half bridge on the same GaN-on-Si wafer is very challenging because the devices share a common conductive Si substrate. In this letter, we propose to use GaN-on-SOI (silicon-on-insulator) to isolate the devices by trench etching through the GaN/Si(111) layers and stopping in the SiO2 buried layer. By well-controlled epitaxy and device fabrication, high-performance 200 V...
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Key words
HEMTs,MODFETs,Substrates,Gallium nitride,Monolithic integrated circuits,Silicon,Etching
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