Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping

•ADF-STEM strain-measurement precision is limited by scanning distortions.•Multi-frame imaging and non-rigid registration can correct scanning-distortions.•Experiment design was tuned for maximum strain precision using a fixed total dose.•Optimised approach was used to study strain fields around aluminium precipitates.•Measured strain fields agree favourably with DFT simulation and HRTEM measurement.