Single Event Testing of SDRAM, DDR2 and DDR3 Memories

2016 IEEE Radiation Effects Data Workshop (REDW)（2016）

Cited 9|Views4

No score

Abstract

SEE test results are presented for SDRAM, DDR2, and DDR3. No tested devices exhibited SEL. SBUs were observed, but no MBUs were observed in data words. SEFI data were taken at low and high speed.

Translated text

Key words

single event testing,sdram,ddr2

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined