Characterization of Si and C implantation induced defects in 4H-SiCVenkata C. Kummari,Mangal Dhoubhadel,Bibhudutta Rout,Tilo Reinert,Daniel Spemann,Weilin Jiang,Floyd D. McDanielBulletin of the American Physical Society(2011)引用 23|浏览5暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要