Analysis of NBTI Degradation in p-type Tunnel FETsWataru Mizubayashi,Takahiro Mori,Koichi Fukuda,Yuki Ishikawa,Yukinori Morita,Shinji Migita,Hiroyuki Ota,Yongxun Liu,S. O'uchi,Junichi Tsukada,Hiromi Yamauchi,Takashi Matsukawa,Meishoku Masahara,Kazuhiko EndoThe Japan Society of Applied Physics(2016)引用 22|浏览17暂无评分关键词nbti degradation,tunnel,p-typeAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要