Local characterization of resistive switching in TaO x thin films with a highly uniform structureAtsushi Tsurumaki-Fukuchi,Masashi Arita,Takayoshi Katase,Hiromichi Ohta,Yasuo TakahashiThe Japan Society of Applied Physics(2016)引用 22|浏览3暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要