Device Nonideality Effects On Image Reconstruction Using Memristor Arrays

Wen Ma,Fuxi Cai,Chao Du,YeonJoo Jeong,Mohammed Affan Zidan,Wei Lu

2016 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)（2016）

引用 17|浏览21

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摘要

We analyze the effects of device variability during experimental image reconstruction using memristor crossbar arrays. The effects of device variability during online and offline training were carefully studied, along with device failures including SAO and SA1. SA1 failure was found to significantly affect image reconstruction results, and a practical approach was developed to mitigate the effects of SA1 failure in memristor crossbars.

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关键词

device nonideality effects,image reconstruction,device variability effects,memristor crossbar arrays,online training,offline training,device failures,SA0 failure,SA1 failure effect mitigation

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