Preliminary Guidelines and Predictions for 14-MeV Neutron SEE Testing

Cécile Weulersse,N. Guibbaud,Anne-Lise Beltrando,Jeremy Galinat,Cyrillle Beltrando,Florent Miller,Patrick Trochet,Dan Alexandrescu

IEEE Transactions on Nuclear Science（2017）

Cited 12|Views33

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Abstract

This paper aims at better defining the scope of applicability of a 14-MeV neutron source for single-event effect characterization. Based on an analysis of the neutron nuclear recoils and experiments on multiple devices (SRAM, SDRAM, FPGA) and feature sizes, the data are compared with results gathered with white neutron beams. As expected, the results are close for single-event upset in most techno...

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Key words

Neutrons,Ions,Particle beams,Silicon,Random access memory,Radiation effects,Testing

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