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Short-Circuit Degradation of 10-kV 10-A SiC MOSFET

IEEE Transactions on Power Electronics(2017)

Cited 70|Views49
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Abstract
The short-circuit behavior of power devices is highly relevant for converter design and fault protection. In this paper, the degradation during short circuit of a 10-kV 10-A 4H-SiC MOSFET is investigated at 6 kV dc-link voltage. The study aims to present the behavior of the device during short-circuit transients as it sustains increasing short-circuit pulses during its lifetime. As the short-circu...
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Key words
Resistance,Degradation,Temperature,MOSFET,Silicon carbide,Logic gates,Electronic mail
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