Fitting analytical BRDF models to low-resolution measurements of light scattered from relief printing samplesNi Yan,Teun Baar,Maria V. Ortiz Segovia,Jan P. Allebachelectronic imaging(2016)引用 1|浏览5暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要