Is It Possible to Image the Auger Electron Signal in a Conventional SEM Using a Segmented Annular BSED and Stage Bias?

Journal Article Is It Possible to Image the Auger Electron Signal in a Conventional SEM Using a Segmented Annular BSED and Stage Bias? Get access BJ Griffin, BJ Griffin Centre for Microscopy, Characterization and Analysis, The University of Western Australia, Crawley, WA Australia Search for other works by this author on: Oxford Academic Google Scholar AA Suvorova, AA Suvorova Centre for Microscopy, Characterization and Analysis, The University of Western Australia, Crawley, WA Australia Search for other works by this author on: Oxford Academic Google Scholar DC Joy, DC Joy Center for NanoPhase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar JR Michael JR Michael Sandia National Laboratories, PO Box 5800, Albuquerque, NM Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 606–607, https://doi.org/10.1017/S1431927616003883 Published: 25 July 2016