Imaging Local Polarization and Domain Boundaries with Picometer-Precision Scanning Transmission Electron Microscopy

Journal Article Imaging Local Polarization and Domain Boundaries with Picometer-Precision Scanning Transmission Electron Microscopy Get access Megan E Holtz, Megan E Holtz School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Julia A Mundy, Julia A Mundy School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Celesta S Chang, Celesta S Chang School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Jarrett A Moyer, Jarrett A Moyer Department of Physics and Materials Research Institute, University of Illinois at Urbana-Champaign, Urbana, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Charles M Brooks, Charles M Brooks Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Hena Das, Hena Das School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Alejandro F Rebola, Alejandro F Rebola School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Robert Hovden, Robert Hovden School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Elliot Padgett, Elliot Padgett School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Craig J Fennie, Craig J Fennie School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar ... Show more Peter Schiffer, Peter Schiffer Department of Physics and Materials Research Institute, University of Illinois at Urbana-Champaign, Urbana, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Dennis Meier, Dennis Meier Department of Materials, ETH Zürich, CH-8093 Zürich, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Darrell G Schlom, Darrell G Schlom Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USAKavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar David A Muller David A Muller School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USAKavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 898–899, https://doi.org/10.1017/S143192761600533X Published: 25 July 2016