The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures
Chinese Journal of Electronics(2016)
Abstract
Heavy ion radiation experiments have been done to DC/DC converters with different topological structures for space applications. The test results were analyzed about the function failure of three topological structures caused by single event effects. The relationship between the function failure and the input supply voltage, the output load current and the topological structure of the module were ...
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Key words
DC-DC power convertors,MOSFET circuits,network topology,radiation hardening (electronics)
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