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An in situ TEM Study of Ferroelastic Domain Mobility

P. Gao, J. Jokisaari,C. Nelson,S.-H. Baek,M. Trassin, C.W. Bark,R. Ramesh,C.-B. Eom, X. Pan

Microscopy and Microanalysis（2013）

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Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
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Key words
ferroelastic domain mobility,situ tem,situ tem study
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