Free-Space Permittivity Measurement at Terahertz Frequencies With a Vector Network Analyzer

A simple system, based on a vector network analyzer, has been used with new numerical de-embedding and parameter inversion techniques to determine the relative permittivity (dielectric properties) of materials within the frequency range 750-1100 GHz. Free-space (noncontact), nondestructive testing has been performed on various planar dielectric and semiconducting samples. This system topology is w...