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Atom Probe Tomography Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode

Ty J. Prosa,D. Olson,A.D. Giddings,W. Lefebvre,Peter H. Clifton,Dj Larson

Microscopy and Microanalysis（2013）

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Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
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Atom Probe Tomography
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