Rapid Stabilization of High-Performance Multicrystalline P-type Silicon PERC Cells

Catherine Chan,David Payne,Brett Hallam,Malcolm Abbott,Tsun H. Fung,Alison Maree Wenham,Budi Tjahjono,Stuart Wenham

IEEE Journal of Photovoltaics（2016）

引用 122|浏览8

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摘要

Light-induced or, more broadly, carrier-induced degradation (CID) in high-performance multicrystalline silicon (TIP mc-Si) solar cells remains a serious issue for many manufacturers, and the root cause of the degradation is still unknown. In this paper, the impact of firing temperature on the stability of lifetime test structures is investigated, and it is found that substantial CID can be trigger...

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关键词

Degradation,Temperature measurement,Silicon,Acceleration,Lifetime estimation,Photovoltaic cells

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