A fast simulation method to measure the circuit nonlinearity
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)(2016)
Abstract
I/O circuits in high speed digital designs often exhibit strong nonlinearity, calling for efficient and effective characterizations. This paper presents a fast method to effectively measure the nonlinearity of the circuits. It provides a first quick assessment of the nonlinearity and helps to better guide the design to save design cost, time and reduce the complexity.
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Key words
Nonlinearity,Circuit Simulation
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