Simultaneous profile measurements of medium- and high-Z impurity concentrations (n$_{\mathrm{Z}}$/n$_{\mathrm{e}})$, T$_{\mathrm{e}}$ , $\Delta $Z$_{\mathrm{eff}}$ and n$_{\mathrm{e}}^{\mathrm{2}}$Z$_{\mathrm{eff}}$ in MCF plasmas from multi-energy x-rays