Fabrication of nanowire growth templates by forming pinholes in SiOx on Si

Huan Zhao Ternehäll,Elham Fadaly,Mahdad Sadeghi

2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)(2016)

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摘要
Summary form only given. InAs nanowire growth is carried out on a thin grainy layer of SiO x on Si (111), utilizing the openings of pinholes in the SiO x layer by isotropic wet etching. SiO x layers with different initial thicknesses were deposited and etched down to different thicknesses, to investigate the influence of the initial layer roughness and the etching depth on the formation of pinholes and thereafter the nanowire growth.
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关键词
nanowire growth template fabrication,InAs nanowire growth,thin grainy layer,pinhole openings,isotropic wet etching,initial thicknesses,initial layer roughness,etching depth,InAs,Si-SiOx
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