Leakage Current Paths in Isolated AlGaN/GaN Heterostructures
IEEE Transactions on Semiconductor Manufacturing(2016)
摘要
Electrical characterization of AlGaN/GaN heterojunctions isolated by Ar-implantation identified three conduction regimes. These include an Ohmic regime below 100 V associated with conduction across the implanted area itself as well as an exponential regime above 400 V associated with a conduction across the buffer or buried interfaces with the substrate. While the extraction of activation energies...
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关键词
Semiconductor device measurement,Leakage currents,Power transistors,Ion implantation,Current measurement,Gallium nitride,Aluminum gallium nitride
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