ESD Robustness Improvement for VDMOS Transistors to Harsh ApplicationsK. Hatasako,Fumitoshi Yamamoto,Akio Uenishi,T. Kuroi,Shigeto MaegawaThe Japan Society of Applied Physics(2008)引用 0|浏览5暂无评分关键词vdmos transistorsAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要