The Differential Absorption Hard X-Ray (Dahx) Spectrometer At The Z Facility

K. S. Bell,C. A. Coverdale,D. J. Ampleford,J. E. Bailey,G. Loisel,V. Harper-Slaboszewicz,J. Schwarz, E. Christener, C. Turner,L. A. Mcpherson, C. Bourdon, M. Kernaghan,M. Sullivan, C. Kirtley,M. E. Cuneo

2016 43RD IEEE INTERNATIONAL CONFERENCE ON PLASMA SCIENCE (ICOPS)（2016）

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摘要

The Differential Absorption Hard X-ray (DAHX) spectrometer has been developed to diagnose photon energies above 80 keV and provides a time-resolved measurement of the x-ray spectrum from the plasma driven by Z. The DAHX spectrometer is a revitalization of the Hard X-Ray Spectrometer (HXRS) fielded on Z prior to refurbishment1. DAHX consists of an array of seven collimated silicon PIN diodes with varying filters in a 2 to 4 inch thick tungsten cylinder that shields the diodes from the surrounding radiation environment. Analyzed data from DAHX will be presented for several wire array experiments.

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关键词

Z machine radiation environment,DAHX data,wire array measurements,short pulse Z-Petawatt laser,diode performance,silicon PIN diode signals,time resolved hard X-ray information,TLD,filtered PCD,hard X-rays,warm X-rays,diagnostic suite,wire array experiments,surrounding radiation environment,collimated silicon PIN diodes,HXRS,Hard X-Ray Spectrometer,DAHX spectrometer,X-ray spectrum,time-resolved measurement,photon energies,Z facility,differential absorption hard X-ray spectrometer,size 2 inch to 4 inch,W

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