Reliable characterization of materials and nanostructured systems <<50nm using coherent EUV beams

Proceedings of SPIE(2016)

引用 0|浏览21
暂无评分
摘要
Coherent extreme ultraviolet beams from tabletop high harmonic generation offer revolutionary capabilities for observing nanoscale systems on their intrinsic length and time scales. By launching and monitoring acoustic waves in such systems, we fully characterize the mechanical properties of sub-50nm films. We find that the Poisson's ratio of low-k dielectric materials does not stay constant as often assumed, but increases when bond coordination is below a critical value. Within the same measurement, by following the heat dissipation dynamics from nano-gratings of width 20-1000nm and different periodicities, we confirm the effects of a newly identified collectively-diffusive regime, where closely-spaced nanowires cool faster than widely-spaced ones.
更多
查看译文
关键词
Ultrafast X-Rays,nanometrology,nano-mechanical properties,ultrathin films,nondiffusive thermal transport,mean free path spectroscopy,photoacoustic,photothermal
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要