Reliability Performance of a 70-GHz Mixer in 65-nm Technology
IEEE Transactions on Device and Materials Reliability（2016）
Abstract
A downconversion mixer using the double-balanced Gilbert cell structure is fabricated using 65-nm CMOS technology. The mixer maximum conversion gain is -0.93 dB, IF output power at the 1-dB compression point is -4 dBm, and IIP3 is 6.12 dBm with IF at 1 GHz. In addition, mixer reliability subjected to dynamic stress at elevated VDD is examined experimentally. Transistor measurement was investigated...
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Key words
Stress,Mixers,Radio frequency,Logic gates,Transistors,Gain,Transconductance
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