System-Independent Characterization of Materials Using Dual-Energy Computed Tomography
IEEE Transactions on Nuclear Science(2016)
Abstract
We present a new decomposition approach for dual-energy computed tomography (DECT) called SIRZ that provides precise and accurate material description, independent of the scanner, over diagnostic energy ranges (30 to 200 keV). System independence is achieved by explicitly including a scanner-specific spectral description in the decomposition method, and a new X-ray-relevant feature space. The feat...
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Key words
Attenuation,Computed tomography,X-ray imaging,Atomic measurements,Absorption,Compounds,Calibration
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