Electron Trapping in GaN-on-Si Power HEMTsMichael J. Uren, Markus Caesar,Indranil Chatterjee,Serge Karboyan,Matteo Meneghini,Gaudenzio Meneghesso,Enrico Zanoni, P. Moens,P. Vanmeerbeek,Martin Kuballinternational conference on networking and services(2015)引用 23|浏览53暂无评分关键词electron,gan-on-siAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要