Surface third and fifth harmonic generation at crystalline Si for non-invasive inspection of Si wafer's inter-layer defects: erratum.

We present an erratum to supplement a missing funding acknowledgment [Pusan National University Research Grant, 2016] in our paper [Y. Gao Opt. Express 26(25), 32812 (2018).]. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement