IBM Z14: Processor Characterization and Power Management for High-Reliability Mainframe Systems

Christopher Berry,David Wolpert, Christos Vezrytzis,Richard Rizzolo,Sean Carey, Yaniv Maroz,Hunter Shi,Dureseti Chidambarrao,Christian Jacobi,Anthony Saporito,Thomas Strach,Alper Buyuktosunoglu,Preetham Lobo,Pierce Chuang,Pawel Owczarczyk,Ramon Bertran,Tobias Webel,Phillip J. Restle

IEEE Journal of Solid-State Circuits（2018）

Cited 15|Views174

Key words

Cache,characterization,computer,critical path monitor (CPM),droop,IBM,mainframe,microprocessor,simultaneous multithreading (SMT),system,transistor,very large scale integration (VLSI),yield,z14

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