Characterization And Calibration Of A Multilayer Coated Wolter Optic For An Imager On The Z-Machine At Sandia National Laboratories

The need for a time-resolved monochromatic x-ray imaging diagnostic at photon energies > 15 keV has motivated the development of aWolter optic to study x-ray sources on the Z-machine at Sandia National Laboratories. The work is performed in both the LLNL's x-ray calibration facility and SNL's microfocus x-ray lab. Characterizations and calibrations include alignment, measurement of throughput within the field of view (FOV), the point-spread function within the FOV both in and out of focus, and bandpass in the FOV. These results are compared with ray tracing models, showing reasonable agreement. Published by AIP Publishing.