Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film.
Micron(2017)
摘要
•Guide for the determination of charge polarity of an electron beam irradiated thin film.•A Scherzer-like band appears in the power spectrum of phase plate images when the sign of defocus opposes the sign of the phase plate phase shift.•Optimization of the imaging condition with hole-free phase plates.
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关键词
Hole-free phase plate,Volta phase plate,Radiation damage,Electron beam induced charging,Thon rings,Fresnel images
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