Augmenting ESD and EOS Physical Analysis with Per Pin ESD and Leakage DFT
2018 19th International Symposium on Quality Electronic Design (ISQED)（2018）
关键词
ESD,EOS,Leakage,Diode,Charge pump,DFT
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2018 19th International Symposium on Quality Electronic Design (ISQED)（2018）