Approximation-aware testing for approximate circuits.

A wide range of applications significantly benefit from the Approximate Computing (AC) paradigm in terms of speed or power reduction. AC achieves this by tolerating errors in the design. These errors are introduced into the design either manually by the designer or by approximate synthesis approaches. From here, the standard design flow is taken. Hence, the manufactured AC chip is eventually tested for production errors using well established fault models. To be precise, if the test for a test pattern fails, the AC chip is sorted out. However, from a general perspective this procedure results in throwing away chips which are perfectly fine taking into account that the considered fault (i.e. physical defect that leads to the error) can still be tolerated because of approximation. This can lead to a significant amount of yield loss. In this paper, we present an approximation-aware test methodology which can be easily integrated into the regular test flow. It is based on a pre-process to identify approximation-redundant faults. By this, we remove all potential faults that no longer need to be tested because they can be tolerated under the given error metric. Our experimental results and case studies on a wide variety of benchmark circuits show a significant potential for yield improvement.